Herestraat 49
3000 Leuven
Belgium
SEM Imaging & Analytical Techniques
We are pleased to invite you to our upcoming session at UCLL, focused on SEM imaging and analytical techniques. This event will be an excellent opportunity for students and industry professionals to share experiences, explore applications, and discover the latest developments in analytical methods such as EDS, EBSD, Windowless EDS and Soft X-ray analysis.
Hands-on Session: A benchtop SEM will be available during the event, giving you the chance to bring your own samples for analysis. Please let us know in advance which samples you would like to have examined so we can prepare accordingly.
17.00 – 18.00 Welcome reception with sandwiches, drinks, and coffee.
18.00 – 19.30 Lecture with Rick Verberne and Fidan B. in Aula 005 - Basic concepts of SEM, SEM imaging and analytical methods in scanning electron microscopy (EDS, windowless EDS, WDS, SXES, EBSD).
19.30 – 21.00 Hands-on Session with Drinks and Snacks - JEOL JCM-7000 Benchtop SEM. Discover how accessible and intuitive high-quality SEM imaging can be.
During this session we will demonstrate:
Suitable sample types and simple preparation guidelines
- How to choose the optimal observation mode (SE, BSE, low-vacuum, etc.)
- Practical use of the instrument’s detectors and imaging features
- Live sample analysis — feel free to bring your own samples
(Please inform us in advance which samples you plan to bring.) - The event also includes a guided lab tour, followed by drinks and snacks to continue discussions and exchange ideas.